New column utility recodes column names.Stacking and fill options added to Line element.New Ridgeline Plots use histogram with a categorical variable for Y.More control over the basis for percentages, allowing 100% stacked bars charts without data prep.Summary statistic property added for Color and Size drop zones in elements that summarize color or size, specifically Points, Line, Bar, Treemap, Heatmap, Box Plot and Contour.Upgraded Variability chart and Oneway Axis.Ability to save prediction formula(s) for Line of Fit and save formula for Bar, Points and Line.New Line of Fit regression line option forRobust Cauchy.Time Series Forecast available in Line of Fit graph.New Interval > Band option allows band from low value to high value.Bagplot (or 2D Box Plot) for continuous XY data added to the Contour element.Improved Contour element with additional options for lines between contours and alpha hull support.New customization options to enhance Heatmap and Box Plot graphs.Import wizard allows import and processing of XML, JSON and.New column header graphs display histograms above each column.Modelers can perform the PLS and hand off the scores to process control engineers so that engineers don’t have to be experts in PLS. When driven by PLS, this reduction in dimensionality is tied to the response, so outliers are tied to what is most important.Built-in dimension reduction further improves performance, allowing computations over a lower-dimensional space.Higher efficiency, as the platform is score-based and does not have to re-compute covariances each time it is run.Graphlet-driven drill-downs that allow you to diagnose and monitor processes without having to launch multiple platforms.The new Model-Driven Multivariate Control Chart platform in JMP 15 offers several benefits: JMP 15 provides control charts that support these relationships, providing a better understanding of actual process performance. When such relationships exist, standard univariate charts will not accurately depict process health. Univariate control charts are unable to account for correlation or functional relationships among multiple parameters. Spend less time table wrangling by using Functional DOEs.Build a better model in less time with automated knot selection.Additionally, with FDE in JMP Pro 15 you can: The custom designer in JMP Pro 15 allows users to specify a functional response, making the subsequent workflow more convenient and less error-prone. JMP Pro 15 adds workflow improvements that let users bypass intermediate table creation reshaping, and joins, especially for functional DOEs. JMP Pro 14 introduced FDE, a powerful platform for working with functional data. No matter what your industry, common difficulties exist with this type of data: simplifying and cleaning up messy data, removing outliers and building models that characterize an underlying function or relate a continuous data stream to measures of performance, such as yield, defect rate or product quality. Hundreds or thousands of such data streams can create a large volume of data, very quickly, posing a unique set of challenges. Scientists and engineers are dealing with more and more data streamed from device-based sensors or batch process monitors. New summary statistic for percentage of grand total.Upgraded Variability chart and Oneway axes.In axes, better default behavior near zero, better handling of log axes in heatmaps.Extended capabilities for the Line element, including the ability to make Area plots.Additional customization for Heatmaps, Treemaps and Boxplots.Four new preferences in the font preference group: Graph Label, Legend, Graph Title and Caption.Smoother: Save Smoother formula, improved handling of log transforms and more control over bumpiness, as well as better matching Bivariate’s smoother.Create two new fits, Robust Cauchy and Time Series Forecast. Graph Builder has many other enhancements in JMP 15, including: Enhanced Graph Builder in JMP 15 means new graphs, including time-series forecasts, more customization options for existing graphs and the ability to drill down for more detail using graphlets. The primary graphing platform in JMP keeps improving.
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